Optical Tester HION based on Shack-Hartmann Wavefront Sensor

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Optical Tester HION is intended for optical surface testing. The technique is based on Shack-Hartmann method. Laser beam reflects from the optical surface under test and goes to Shack-Hartmann Wavefront Sensor for further processing.

Specification:

• Input aperture - 10 to 50 mm (optionally up to 300 mm)
• Time of measurement - 10 ms
• Accuracy of measurements - 0.032 μm (P-V)
• P-V of measured aberrations - up to 5 μm
• Light source - diode laser
• Wavelength - 0.65 μm
• CCD/CMOS Camera

The results are presented as:

• P-V and RMS
• Expansion of aberrations to Seidel and Zernike polynomials (tilts, defocus, astigmatisms, etc.)
• Fringe Representation, 2D & 3D Wavefront

For additional information please contact kud[@]activeoptics.ru.

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